Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/1400
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dc.contributor.authorChoulis, Stelios A.-
dc.contributor.authorAndreev, Aleksey D.-
dc.contributor.authorMerrick, Michael L.-
dc.contributor.otherΧούλης, Στέλιος Α.-
dc.date.accessioned2013-03-06T15:37:16Zen
dc.date.accessioned2013-05-17T05:22:58Z-
dc.date.accessioned2015-12-02T10:12:18Z-
dc.date.available2013-03-06T15:37:16Zen
dc.date.available2013-05-17T05:22:58Z-
dc.date.available2015-12-02T10:12:18Z-
dc.date.issued2003-02-
dc.identifier.citationApplied physics letters, 2003, vol. 82, no. 8, pp. 1149-1151en_US
dc.identifier.issn10773118-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/1400-
dc.description.abstractThe spontaneous electroluminescence emission of InAs light-emitting diodes (LEDs) operating at 3.3 μm was studied as a function of applied hydrostatic pressure. An enhancement of a factor of almost four in radiative efficiency at room temperature was observed in the range 0 to 10 kbar. Analysis of the dependence of electroluminescence emission intensity on hydrostatic pressure at constant current reveals that nonradiative Auger recombination dominates the quantum efficiency of these LEDsen_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofApplied Physics Lettersen_US
dc.rights© American Institute of Physicsen_US
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 United States*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/us/*
dc.subjectLight emitting diodesen_US
dc.subjectElectroluminescenceen_US
dc.subjectIndium compoundsen_US
dc.subjectLiquid phase epitaxyen_US
dc.subjectPhotolithographyen_US
dc.subjectPressure--Measurementen_US
dc.titleHigh-pressure measurements of mid-infrared electroluminescence from InAs light-emitting diodes at 3.3 μmen_US
dc.typeArticleen_US
dc.affiliationUniversity of Surreyen
dc.collaborationUnicersity of Surreyen_US
dc.journalsHybrid Open Accessen_US
dc.countryCyprusen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1063/1.1555276en_US
dc.dept.handle123456789/54en
dc.relation.issue8en_US
dc.relation.volume82en_US
cut.common.academicyear2003-2004en_US
dc.identifier.spage1149en_US
dc.identifier.epage1151en_US
item.fulltextNo Fulltext-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
item.languageiso639-1en-
crisitem.journal.journalissn1077-3118-
crisitem.journal.publisherAmerican Institute of Physics-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-7899-6296-
crisitem.author.parentorgFaculty of Engineering and Technology-
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