Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/13952
Title: Fault tolerant event localization in sensor networks using binary data
Authors: Michaelides, Michalis P. 
Panayiotou, Christos G.
Major Field of Science: Engineering and Technology
Field Category: Electrical Engineering - Electronic Engineering - Information Engineering
Keywords: Fault tolerance;Wireless sensor networks;Maximum likelihood estimation;Robustness;Sensor arrays;Maximum likelihood detection;Event detection;Radar tracking;Acoustic applications;Working environment noise
Issue Date: 30-Sep-2008
Source: 2008 American Control Conference, ACC; Seattle, WA; United States; 11 June 2008 through 13 June 2008
Conference: Proceedings of the American Control Conference 
Abstract: This paper investigates the use of wireless sensor networks for estimating the location of an event that emits a signal which propagates over a large region. In this context, we assume that the sensors make binary observations and report the event if the measured signal at their location is above a threshold; otherwise they remain silent. Based on the sensor binary beliefs we use 4 different estimators to localize the event: CE (Centroid Estimator), ML (Maximum Likelihood), SNAP (Subtract on Negative Add on Positive) and AP (Add on Positive). The main contribution of this paper is the fault tolerance analysis of the proposed estimators. Furthermore, the analysis shows that SNAP is the most fault tolerant of all estimators considered. ©2008 AACC.
ISBN: 978-1-4244-2078-0
ISSN: 0743-1619
DOI: 10.1109/ACC.2008.4586977
Rights: © IEEE
Type: Conference Papers
Affiliation : University of Cyprus 
Publication Type: Peer Reviewed
Appears in Collections:Δημοσιεύσεις σε συνέδρια /Conference papers or poster or presentation

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