Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/13913
DC FieldValueLanguage
dc.contributor.authorMichaelides, Michalis P.-
dc.contributor.authorPanayiotou, Christos-
dc.contributor.authorLaoudias, Christos-
dc.date.accessioned2019-05-31T09:03:53Z-
dc.date.available2019-05-31T09:03:53Z-
dc.date.issued2011-09-02-
dc.identifier.citation2011 IEEE International Conference on Communications, ICC 2011; Kyoto; Japan; 5 June 2011 through 9 June 2011en_US
dc.identifier.isbn978-1-61284-233-2-
dc.identifier.issn1938-1883-
dc.description.abstractThe increasing demand for indoor location-based services has motivated the development of positioning methods that exploit the existing wireless network infrastructure. Accuracy is an important requirement, however fault tolerance is also highly desirable in case of failures or malicious attacks. We investigate the fault tolerance of fingerprint-based methods under a variety of fault or attack scenarios. We study the Subtract on Negative Add on Positive (SNAP) algorithm and modify it appropriately for the WLAN setup. Our results indicate that SNAP achieves adequate accuracy with very low computational complexity and exhibits smoother performance degradation in the presence of faults compared to other methods. © 2011 IEEE.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.rights© IEEEen_US
dc.subjectFault toleranceen_US
dc.subjectFault tolerant systemsen_US
dc.subjectAccuracyen_US
dc.subjectWireless LANen_US
dc.subjectEstimationen_US
dc.subjectIEEE Communications Societyen_US
dc.subjectDegradationen_US
dc.titleFault tolerant fingerprint-based positioningen_US
dc.typeConference Papersen_US
dc.collaborationUniversity of Cyprusen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.countryCyprusen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.relation.conferenceIEEE International Conference on Communicationsen_US
dc.identifier.doi10.1109/icc.2011.5963136en_US
dc.identifier.scopus2-s2.0-80052185731en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/80052185731en
dc.contributor.orcid#NODATA#en
dc.contributor.orcid#NODATA#en
dc.contributor.orcid#NODATA#en
cut.common.academicyear2011-2012en_US
item.languageiso639-1en-
item.openairecristypehttp://purl.org/coar/resource_type/c_c94f-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.openairetypeconferenceObject-
item.cerifentitytypePublications-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-0549-704X-
crisitem.author.parentorgFaculty of Engineering and Technology-
Appears in Collections:Δημοσιεύσεις σε συνέδρια /Conference papers or poster or presentation
CORE Recommender
Show simple item record

SCOPUSTM   
Citations 50

9
checked on Mar 14, 2024

Page view(s) 50

270
Last Week
5
Last month
4
checked on Jul 25, 2024

Google ScholarTM

Check

Altmetric


Items in KTISIS are protected by copyright, with all rights reserved, unless otherwise indicated.