Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/13897
DC FieldValueLanguage
dc.contributor.authorHynynen, Kullervo-
dc.contributor.authorFan, Xiaobing-
dc.contributor.authorDamianou, Christakis A.-
dc.date.accessioned2019-05-31T08:47:58Z-
dc.date.available2019-05-31T08:47:58Z-
dc.date.issued1995-01-01-
dc.identifier.citationIEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, 1995, vol. 42, no. 2, pp. 182-187en_US
dc.identifier.issn08853010-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/13897-
dc.description.abstractThe concept of thermal dose as a predictor for the size of the necrosed tissue volume during high-intensity focussed ultrasound surgery was tested. The sensitivity of the predicted lesion size to the uncertainties in the iso-dose constant, attenuation coefficient, and thermal dose threshold of necrosis was studied. The predicted lesion size appears to be independent of attenuation at some high attenuation values and certain depth in tissue. Thus, for a given target depth, a proper selection of frequency could minimize the lesion size variability due to uncertainty in the tissue attenuation. The predicted lesion size was less dependent on the uncertainties in the iso-dose constant and thermal dose of necrosis. The predictions of the model were compared with experimental data in rabbit muscle, and experimental data in cat and rat brain measured by others. The agreement was found to be good in most of the experiments. Similarly, the model was found to predict well the trends of increasing power and pulse duration. 0885-3010/95$04.00 © 1995 IEEEen_US
dc.language.isoenen_US
dc.relation.ispartofIEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Controlen_US
dc.rights© IEEEen_US
dc.subjectNecrosed tissue volumeen_US
dc.subjectSommerfield integral techniquesen_US
dc.subjectUltrasound surgeryen_US
dc.titleEvaluation of Accuracy of a Theoretical Model for Predicting the Necrosed Tissue Volume during Focused Ultrasound Surgeryen_US
dc.typeArticleen_US
dc.collaborationIndiana Universityen_US
dc.collaborationHarvard Universityen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.countryUnited Statesen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1109/58.365232en_US
dc.identifier.scopus2-s2.0-0029274335en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/0029274335en
dc.contributor.orcid#NODATA#en
dc.contributor.orcid#NODATA#en
dc.contributor.orcid#NODATA#en
dc.relation.issue2en_US
dc.relation.volume42en_US
cut.common.academicyear2019-2020en_US
item.languageiso639-1en-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.openairetypearticle-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0003-0424-2851-
crisitem.author.parentorgFaculty of Engineering and Technology-
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