Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/13814
DC FieldValueLanguage
dc.contributor.authorAndreou, Andreas S.-
dc.contributor.authorLeonidou, Constantinos N.-
dc.date.accessioned2019-05-27T06:04:44Z-
dc.date.available2019-05-27T06:04:44Z-
dc.date.issued2005-05-01-
dc.identifier.citation7th International Conference on Enterprise Information Systems, Miami, United States, 25 May 2005 through 28 May 2005en_US
dc.identifier.isbn9728865198-
dc.descriptionProceedings of the 7th International Conference on Enterprise Information Systems 2005, Pages 138-145en_US
dc.description.abstractSoftware reliability is directly related to the number and time of occurrence of software failures. Thus, if we were able to reveal and characterize the behavior of the evolution of actual software failures over time then we could possibly build more accurate models for estimating and predicting software reliability. This paper focuses on the study of the nature of empirical software failure data via a nonparametric statistical framework. Six different time-series data expressing times between successive software failures were investigated and a random behavior was detected with evidences favoring a pink noise explanation.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.subjectSoftware failureen_US
dc.subjectAntipersistenceen_US
dc.subjectNonparametric analysisen_US
dc.subjectReliabilityen_US
dc.titleNonparametric analysis of software reliability: Revealing the nature of software failure dataseriesen_US
dc.typeConference Papersen_US
dc.collaborationUniversity of Cyprusen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.countryCyprusen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.relation.conferenceInternational Conference on Enterprise Information Systemsen_US
dc.identifier.scopus2-s2.0-78649276193en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/78649276193en
dc.contributor.orcid#NODATA#en
dc.contributor.orcid#NODATA#en
cut.common.academicyear2004-2005en_US
item.fulltextNo Fulltext-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_c94f-
item.openairetypeconferenceObject-
item.languageiso639-1en-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0001-7104-2097-
crisitem.author.parentorgFaculty of Engineering and Technology-
Appears in Collections:Δημοσιεύσεις σε συνέδρια /Conference papers or poster or presentation
CORE Recommender
Show simple item record

Page view(s) 50

280
Last Week
3
Last month
8
checked on May 11, 2024

Google ScholarTM

Check

Altmetric


Items in KTISIS are protected by copyright, with all rights reserved, unless otherwise indicated.