Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/13798
DC FieldValueLanguage
dc.contributor.authorAndreou, Andreas S.-
dc.contributor.authorSofokleous, Anastasis A.-
dc.date.accessioned2019-05-24T10:17:23Z-
dc.date.available2019-05-24T10:17:23Z-
dc.date.issued2008-11-
dc.identifier.citationJournal of Systems and Software, 2008, vol. 81, no. 11, pp. 1883-1898en_US
dc.identifier.issn01641212-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/13798-
dc.description.abstractThis paper proposes a dynamic test data generation framework based on genetic algorithms. The framework houses a Program Analyser and a Test Case Generator, which intercommunicate to automatically generate test cases. The Program Analyser extracts statements and variables, isolates code paths and creates control flow graphs. The Test Case Generator utilises two optimisation algorithms, the Batch-Optimistic (BO) and the Close-Up (CU), and produces a near to optimum set of test cases with respect to the edge/condition coverage criterion. The efficacy of the proposed approach is assessed on a number of programs and the empirical results indicate that its performance is significantly better compared to existing dynamic test data generation methods.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofJournal of Systems and Softwareen_US
dc.rights© 2008 Elsevieren_US
dc.subjectSoftware testingen_US
dc.subjectAutomatic test cases generationen_US
dc.subjectGenetic algorithmsen_US
dc.titleAutomatic, evolutionary test data generation for dynamic software testingen_US
dc.typeArticleen_US
dc.collaborationUniversity of Cyprusen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.journalsSubscriptionen_US
dc.countryCyprusen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1016/j.jss.2007.12.809en_US
dc.identifier.scopus2-s2.0-52049106859en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/52049106859en
dc.contributor.orcid#NODATA#en
dc.contributor.orcid#NODATA#en
dc.relation.issue11en_US
dc.relation.volume81en_US
cut.common.academicyear2008-2009en_US
dc.identifier.spage1883en_US
dc.identifier.epage1898en_US
item.openairetypearticle-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.languageiso639-1en-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0001-7104-2097-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.journal.journalissn0164-1212-
crisitem.journal.publisherElsevier-
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