Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.14279/13798
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Andreou, Andreas S. | - |
dc.contributor.author | Sofokleous, Anastasis A. | - |
dc.date.accessioned | 2019-05-24T10:17:23Z | - |
dc.date.available | 2019-05-24T10:17:23Z | - |
dc.date.issued | 2008-11 | - |
dc.identifier.citation | Journal of Systems and Software, 2008, vol. 81, no. 11, pp. 1883-1898 | en_US |
dc.identifier.issn | 01641212 | - |
dc.identifier.uri | https://hdl.handle.net/20.500.14279/13798 | - |
dc.description.abstract | This paper proposes a dynamic test data generation framework based on genetic algorithms. The framework houses a Program Analyser and a Test Case Generator, which intercommunicate to automatically generate test cases. The Program Analyser extracts statements and variables, isolates code paths and creates control flow graphs. The Test Case Generator utilises two optimisation algorithms, the Batch-Optimistic (BO) and the Close-Up (CU), and produces a near to optimum set of test cases with respect to the edge/condition coverage criterion. The efficacy of the proposed approach is assessed on a number of programs and the empirical results indicate that its performance is significantly better compared to existing dynamic test data generation methods. | en_US |
dc.format | en_US | |
dc.language.iso | en | en_US |
dc.relation.ispartof | Journal of Systems and Software | en_US |
dc.rights | © 2008 Elsevier | en_US |
dc.subject | Software testing | en_US |
dc.subject | Automatic test cases generation | en_US |
dc.subject | Genetic algorithms | en_US |
dc.title | Automatic, evolutionary test data generation for dynamic software testing | en_US |
dc.type | Article | en_US |
dc.collaboration | University of Cyprus | en_US |
dc.subject.category | Electrical Engineering - Electronic Engineering - Information Engineering | en_US |
dc.journals | Subscription | en_US |
dc.country | Cyprus | en_US |
dc.subject.field | Engineering and Technology | en_US |
dc.publication | Peer Reviewed | en_US |
dc.identifier.doi | 10.1016/j.jss.2007.12.809 | en_US |
dc.identifier.scopus | 2-s2.0-52049106859 | en |
dc.identifier.url | https://api.elsevier.com/content/abstract/scopus_id/52049106859 | en |
dc.contributor.orcid | #NODATA# | en |
dc.contributor.orcid | #NODATA# | en |
dc.relation.issue | 11 | en_US |
dc.relation.volume | 81 | en_US |
cut.common.academicyear | 2008-2009 | en_US |
dc.identifier.spage | 1883 | en_US |
dc.identifier.epage | 1898 | en_US |
item.openairetype | article | - |
item.cerifentitytype | Publications | - |
item.fulltext | No Fulltext | - |
item.grantfulltext | none | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.languageiso639-1 | en | - |
crisitem.author.dept | Department of Electrical Engineering, Computer Engineering and Informatics | - |
crisitem.author.faculty | Faculty of Engineering and Technology | - |
crisitem.author.orcid | 0000-0001-7104-2097 | - |
crisitem.author.parentorg | Faculty of Engineering and Technology | - |
crisitem.journal.journalissn | 0164-1212 | - |
crisitem.journal.publisher | Elsevier | - |
Appears in Collections: | Άρθρα/Articles |
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