Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/1359
Title: Structure and energetics of si nanocrystals embedded in a-sio2
Authors: Hadjisavvas, George C. 
Kelires, Pantelis C. 
metadata.dc.contributor.other: Κελίρης, Παντελής
Major Field of Science: Engineering and Technology
Field Category: ENGINEERING AND TECHNOLOGY
Keywords: Nanocrystals;Chemical bonds;Computer simulation;Molecular structure;Nanostructured materials;Silicon
Issue Date: 24-Nov-2004
Source: Physical Review Letters, 2004, vol. 93, no. 22
Volume: 93
Issue: 22
End page: Physical Review Letters
Abstract: The influence of embedding amorphous oxide matrix on the interface properties of Si nanocrystals was analyzed. It was found that the low-energy geometries at the interface were the Si-O-Si bridge bonds. It was observed that the embedding caused substantial deformation in such small Si nanocrystals. It was also found that the interface properties of Si nanocrystals were strongly influenced by the embedding amorphous oxide matrix, especially when they attained sizes smaller than 2nm.
URI: https://hdl.handle.net/20.500.14279/1359
ISSN: 10797114
DOI: 10.1103/PhysRevLett.93.226104
Rights: © The American Physical Society.
Type: Article
Affiliation: University of Crete 
Affiliation : University of Crete 
Publication Type: Peer Reviewed
Appears in Collections:Άρθρα/Articles

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