Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.14279/1359| Title: | Structure and energetics of si nanocrystals embedded in a-sio2 |
| Authors: | Hadjisavvas, George C. Kelires, Pantelis C. |
| metadata.dc.contributor.other: | Κελίρης, Παντελής |
| Major Field of Science: | Engineering and Technology |
| Field Category: | ENGINEERING AND TECHNOLOGY |
| Keywords: | Nanocrystals;Chemical bonds;Computer simulation;Molecular structure;Nanostructured materials;Silicon |
| Issue Date: | 24-Nov-2004 |
| Source: | Physical Review Letters, 2004, vol. 93, no. 22 |
| Volume: | 93 |
| Issue: | 22 |
| End page: | Physical Review Letters |
| Abstract: | The influence of embedding amorphous oxide matrix on the interface properties of Si nanocrystals was analyzed. It was found that the low-energy geometries at the interface were the Si-O-Si bridge bonds. It was observed that the embedding caused substantial deformation in such small Si nanocrystals. It was also found that the interface properties of Si nanocrystals were strongly influenced by the embedding amorphous oxide matrix, especially when they attained sizes smaller than 2nm. |
| URI: | https://hdl.handle.net/20.500.14279/1359 |
| ISSN: | 10797114 |
| DOI: | 10.1103/PhysRevLett.93.226104 |
| Rights: | © The American Physical Society. |
| Type: | Article |
| Affiliation: | University of Crete |
| Affiliation : | University of Crete |
| Publication Type: | Peer Reviewed |
| Appears in Collections: | Άρθρα/Articles |
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