Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/1358
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dc.contributor.authorChoulis, Stelios A.-
dc.contributor.authorHosea, Thomas Jeff Cockburn-
dc.contributor.authorGhosh, Sandip Kumar-
dc.contributor.otherΧούλης, Στέλιος Α.-
dc.date.accessioned2013-03-06T15:23:22Zen
dc.date.accessioned2013-05-17T05:22:58Z-
dc.date.accessioned2015-12-02T10:16:56Z-
dc.date.available2013-03-06T15:23:22Zen
dc.date.available2013-05-17T05:22:58Z-
dc.date.available2015-12-02T10:16:56Z-
dc.date.issued2003-08-
dc.identifier.citationIEEE photonics technology letters, 2003, vol. 15, no. 8, pp. 1026-1028en_US
dc.identifier.issn10411135-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/1358-
dc.description.abstractWe report electroreflectance (ER) measurements on a dilute-N GaInNAs vertical-cavity surface-emitting laser structure, as a function of temperature T, which probe the coupling between the cavity mode (CM) and a broad quantum-well (QW) ground state exciton. The latter is not separately observable in the ER, but, by monitoring the coupled CM-QW lineshape, we show it has maximum amplitude and is anti-symmetric when the CM and QW energies coincide at a certain T/sub opt/. This predicted T/sub opt/ is confirmed by optically pumped lasing measurements on the same sampleen_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofIEEE Photonics Technology Lettersen_US
dc.rights© IEEEen_US
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 United States*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/us/*
dc.subjectOptical pumpingen_US
dc.subjectErbiumen_US
dc.subjectSpectroscopyen_US
dc.subjectGallium arsenideen_US
dc.subjectIndium compoundsen_US
dc.titlePostgrowth nondestructive characterization of dilute-nitride VCSELs using electroreflectance spectroscopyen_US
dc.typeArticleen_US
dc.affiliationImperial College Londonen
dc.collaborationImperial College Londonen_US
dc.subject.categoryENGINEERING AND TECHNOLOGYen_US
dc.journalsHybrid Open Accessen_US
dc.countryCyprusen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1109/LPT.2003.815364en_US
dc.dept.handle123456789/54en
dc.relation.issue8en_US
dc.relation.volume15en_US
cut.common.academicyear2003-2004en_US
dc.identifier.spage1026en_US
dc.identifier.epage1028en_US
item.grantfulltextnone-
item.languageiso639-1en-
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
item.fulltextNo Fulltext-
crisitem.journal.journalissn10411135-
crisitem.journal.publisherIEEE-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-7899-6296-
crisitem.author.parentorgFaculty of Engineering and Technology-
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