Organization name
IMEL/NCSR Demokritos


Αποτελέσματα για 1-3 από 3.

Ημερομηνία ΈκδοσηςΤίτλοςΣυγγραφέαςJournal
129-Οκτ-2008Simulation of the electrical characteristics of MOS capacitors on strained-silicon substratesKelaidis, N. ; Tsamis, Christos ; Skarlatos, Dimitrios Physica Status Solidi (C) 
2Απρ-2007Quantum confinement and interface structure of Si nanocrystals of sizes 3–5 nm embedded in a-SiO2Lioudakis, Emmanouil ; Othonos, Andreas S. ; Hadjisavvas, George C. ; Nassiopoulou, Androula Galiouna ; Kelires, Pantelis C. Physica E: Low-Dimensional Systems and Nanostructures 
33-Νοε-2008Influence of thermal processing on the electrical characteristics of MOS capacitors on strained-silicon substratesKelaidis, N. ; Ioannou-Sougleridis, Vassilios ; Tsamis, Christos ; Krontiras, Christoforos A. ; Georga, Stavroula N. ; Kellerman, Bruce K. ; Seacrist, Mike R. ; Skarlatos, Dimitrios Thin Solid Films