Organization name
IMEL/NCSR Demokritos


Results 1-3 of 3 (Search time: 0.0 seconds).

Issue DateTitleAuthor(s)
129-Oct-2008Simulation of the electrical characteristics of MOS capacitors on strained-silicon substratesKelaidis, N. ; Tsamis, Christos ; Skarlatos, Dimitrios 
2Apr-2007Quantum confinement and interface structure of Si nanocrystals of sizes 3–5 nm embedded in a-SiO2Lioudakis, Emmanouil ; Othonos, Andreas S. ; Hadjisavvas, George C. ; Nassiopoulou, Androula Galiouna ; Kelires, Pantelis C. 
33-Nov-2008Influence of thermal processing on the electrical characteristics of MOS capacitors on strained-silicon substratesKelaidis, N. ; Ioannou-Sougleridis, Vassilios ; Tsamis, Christos ; Krontiras, Christoforos A. ; Georga, Stavroula N. ; Kellerman, Bruce K. ; Seacrist, Mike R. ; Skarlatos, Dimitrios