1. Ktisis Cyprus University of Technology

Journals Journal of Applied Physics

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Journal description

Name
Journal of Applied Physics
Subjects
Dielectrics
Electrical discharges
Magnetism
Photonics
ISSN
1089-7550
Description
The Journal of Applied Physics (JAP) is an influential international journal publishing significant new experimental and theoretical results of applied physics research.
Impact Factor (2 years)
2.328
Publisher
American Institute of Physics
Journal Webpage
Journal type
Subscription Journal

Journals Publications
(All)


Αποτελέσματα για 1-9 από 9.

Ημερομηνία ΈκδοσηςΤίτλοςΣυγγραφέας
1Οκτ-2012Optical and Elastic Properties of Diamond-like Carbon with Metallic Inclusions: a Theoretical StudyTritsaris, Georgios A. ; Kelires, Pantelis C. ; Mathioudakis, Christos 
23-Μαΐ-2012Intrinsic Stress in ZrN Thin Films: Evaluation of Grain Boundary Contribution From in Situ Wafer Curvature and Ex Situ x-ray Diffraction TechniquesAbadias, Gregory ; Koutsokeras, Loukas E. 
315-Αυγ-2011Texture and microstructure evolution in single-phase TixTa 1-xN alloys of rocksalt structureAbadias, Gregory ; Patsalas, Panos ; Koutsokeras, Loukas E. 
415-Μαΐ-2009Structure and electronic properties of conducting, ternary Ti xTa 1-xN filmsMatenoglou, G. M. ; Lekka, Christina E. ; Koutsokeras, Loukas E. ; Karras, Gabriel ; Kosmidis, Constantine E. ; Evangelakis, Georgios Antomiou ; Patsalas, Panos A. 
52008Optical properties, structural parameters, and bonding of highly textured rocksalt tantalum nitride filmsMatenoglou, G. M. ; Lekka, Christina E. ; Koutsokeras, Loukas E. ; Abadias, Gregory ; Camelio, S. ; Evangelakis, Georgios Antomiou ; Kosmidis, C. ; Patsalas, Panos A. 
613-Οκτ-2007Recent progress in solution processable organic light emitting devicesChoulis, Stelios A. ; So, Franky ; Krummacher, Benjamin C. 
71-Σεπ-2006General method to evaluate substrate surface modification techniques for light extraction enhancement of organic light emitting diodesChoulis, Stelios A. ; Krummacher, Benjamin C. ; Mathai, Mathew K. 
815-Μαρ-2002Characterization of reflectivity inversion, α- and β-phase transitions and nanostructure formation in hydrogen activated thin pd films on silicon based substratesKalli, Kyriacos ; Othonos, Andreas S. ; Christofidès, Constantinos 
9Σεπ-1999Nondestructive evaluation of metal contaminated silicon wafers using radiometric measurementsKalli, Kyriacos ; Christofidès, Constantinos ; Othonos, Andreas S. ; Tardiff, F.