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Ktisis Cyprus University of Technology
Research Outputs
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Negative bias temperature instability (NBTI)
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Issue Date
Title
Author(s)
1-Dec-2013
Use it or lose it: Wear-out and lifetime in future chip multiprocessors
Kim, Hyungjun
; Vitkovskiy, Arseniy
; Gratz, Paul V.
; Soteriou, Vassos
