Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/3062
DC FieldValueLanguage
dc.contributor.authorKasparis, Takis-
dc.contributor.authorKim, Sung Soo-
dc.contributor.authorSchiavone, Guy A.-
dc.contributor.otherΚασπαρής, Τάκης-
dc.date.accessioned2013-02-18T13:44:26Zen
dc.date.accessioned2013-05-17T05:33:56Z-
dc.date.accessioned2015-12-02T12:33:14Z-
dc.date.available2013-02-18T13:44:26Zen
dc.date.available2013-05-17T05:33:56Z-
dc.date.available2015-12-02T12:33:14Z-
dc.date.issued1996-06-07-
dc.identifier.citationThe International Society for Optical Engineering, 1996, vol. 2750, pp. 180-190en_US
dc.identifier.isbn0819421316-
dc.description.abstractRecognition of 3D objects independent of size, position, and rotation is an important and difficult subject in computer vision. A 3D feature extraction method referred to as the Open Ball Operator (OBO) is proposed as an approach to solving the 3D object recognition problem. The OBO feature extraction method has the three characteristics of invariance to rotation, scaling, and translation invariance. Additionally, the OBO is capable of distinguishing between convexities and concavities in the surface of 3D object. The OBO also exhibits a good robustness to noise and uncertainty caused by inaccuracies in 3D measurements. A wavelet de- noising method is used for filtering out noise contained in the feature vectors of 3D objects.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.rights© 1996 SPIEen_US
dc.subjectPattern recognitionen_US
dc.subjectComputer visionen_US
dc.subjectThree-dimensional imagingen_US
dc.titleThree-dimensional object recognition using wavelets for feature denoisingen_US
dc.typeConference Papersen_US
dc.affiliationUniversity of Central Floridaen
dc.collaborationUniversity of Central Floridaen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.countryUnited Statesen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.relation.conferenceSPIE Conference Proceedingsen_US
dc.identifier.doi10.1117/12.241988en_US
dc.dept.handle123456789/54en
cut.common.academicyear1995-1996en_US
item.languageiso639-1en-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.openairetypeconferenceObject-
item.openairecristypehttp://purl.org/coar/resource_type/c_c94f-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0003-3486-538x-
crisitem.author.parentorgFaculty of Engineering and Technology-
Appears in Collections:Κεφάλαια βιβλίων/Book chapters
CORE Recommender
Show simple item record

Page view(s) 50

384
Last Week
0
Last month
2
checked on Oct 4, 2024

Google ScholarTM

Check

Altmetric


Items in KTISIS are protected by copyright, with all rights reserved, unless otherwise indicated.