Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/10423
DC FieldValueLanguage
dc.contributor.authorSoteriou, Vassosen_US
dc.date.accessioned2017-10-25T14:39:26Z-
dc.date.available2017-10-25T14:39:26Z-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/10423-
dc.relation.reviewIEEE CACen_US
cut.common.academicyear2017-2018en_US
cut.review.typeConferenceen_US
item.grantfulltextnone-
item.fulltextNo Fulltext-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-2818-0459-
crisitem.author.parentorgFaculty of Engineering and Technology-
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