Statistics: IEEE Journal of Emerging and Selected Topics in Power Electronics

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ID: 41947 - A Defects-Based Model on the Barrier Height Behavior in 3C-SiC-on-Si Schottky Barrier Diodes	8
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	Jan	Feb	Mar	Apr	May	Jun	Jul	Aug	Sep	Oct	Nov	Dec	Tot
2024	0	0	0	0	0	0	0	8	0	0	0	0	8
Ever													8