Refined By:
Date Issued:  [2010 TO 2019]
Journal:  Journal of Applied Physics

Results 1-2 of 2 (Search time: 0.001 seconds).

Issue DateTitleAuthor(s)
13-May-2012Intrinsic Stress in ZrN Thin Films: Evaluation of Grain Boundary Contribution From in Situ Wafer Curvature and Ex Situ x-ray Diffraction TechniquesAbadias, Gregory ; Koutsokeras, Loukas E. 
215-Aug-2011Texture and microstructure evolution in single-phase TixTa 1-xN alloys of rocksalt structureAbadias, Gregory ; Patsalas, Panos ; Koutsokeras, Loukas E.