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Date Issued:  [2010 TO 2019]
Journal:  Journal of Applied Physics
Date Issued:  2012

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Issue DateTitleAuthor(s)
13-May-2012Intrinsic Stress in ZrN Thin Films: Evaluation of Grain Boundary Contribution From in Situ Wafer Curvature and Ex Situ x-ray Diffraction TechniquesAbadias, Gregory ; Koutsokeras, Loukas E.