Othonos, Andreas S. (rp00384)

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Journal: Journal of Applied Physics

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		Issue Date	Title	Author(s)
	1	15-Mar-2002	Characterization of reflectivity inversion, α- and β-phase transitions and nanostructure formation in hydrogen activated thin pd films on silicon based substrates	Kalli, Kyriacos ; Othonos, Andreas S. ; Christofidès, Constantinos
	2	Sep-1999	Nondestructive evaluation of metal contaminated silicon wafers using radiometric measurements	Kalli, Kyriacos ; Christofidès, Constantinos ; Othonos, Andreas S. ; Tardiff, F.