Refined By:
Date Issued:  [2010 TO 2019]
Publisher:  American Institute of Physics

Results 1-3 of 3 (Search time: 0.001 seconds).

Issue DateTitleAuthor(s)
13-May-2012Intrinsic Stress in ZrN Thin Films: Evaluation of Grain Boundary Contribution From in Situ Wafer Curvature and Ex Situ x-ray Diffraction TechniquesAbadias, Gregory ; Koutsokeras, Loukas E. 
215-Aug-2011Texture and microstructure evolution in single-phase TixTa 1-xN alloys of rocksalt structureAbadias, Gregory ; Patsalas, Panos ; Koutsokeras, Loukas E. 
3Jul-2010Reactive magnetron cosputtering of hard and conductive ternary nitride thin films: Ti–Zr–N and Ti–Ta–NAbadias, Gregory ; Dub, Sergey N. ; Koutsokeras, Loukas E.