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Date Issued:  [2000 TO 2009]
Journal:  Thin Solid Films

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Issue DateTitleAuthor(s)
13-Nov-2008Influence of thermal processing on the electrical characteristics of MOS capacitors on strained-silicon substratesKelaidis, N. ; Ioannou-Sougleridis, Vassilios ; Tsamis, Christos ; Krontiras, Christoforos A. ; Georga, Stavroula N. ; Kellerman, Bruce K. ; Seacrist, Mike R. ; Skarlatos, Dimitrios