Browsing by Subject UHV

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Issue DateTitleAuthor(s)
1-Aug-2019Optimal edge termination for high oxide reliability aiming 10kV SiC n-IGBTsPerkins, Samuel ; Antoniou, Marina ; Tiwari, Amit K. ; Arvanitopoulos, A. ; Gyftakis, K. N. ; Trajkovic, T. ; Udrea, F. ; Lophitis, Neophytos