1. Ktisis Cyprus University of Technology
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Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/1649
DC FieldValueLanguage
dc.contributor.authorKalli, Kyriacos-
dc.contributor.authorJackson, David A.-
dc.contributor.authorWebb, David J.-
dc.contributor.authorRao, Yunjiang-
dc.contributor.authorBrady, Garret P.-
dc.contributor.authorZhang, Lin-
dc.contributor.authorBennion, Ian-
dc.contributor.otherΚαλλή, Κυριάκος-
dc.date.accessioned2013-02-22T14:32:41Zen
dc.date.accessioned2013-05-17T05:22:35Z-
dc.date.accessioned2015-12-02T09:55:24Z-
dc.date.available2013-02-22T14:32:41Zen
dc.date.available2013-05-17T05:22:35Z-
dc.date.available2015-12-02T09:55:24Z-
dc.date.issued1995-06-08-
dc.identifier.citationElectronics Letters,1995, vol. 31, no. 12, pp. 1009-1010en_US
dc.identifier.issn1350911X-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/1649-
dc.description.abstractA prototype fibre-optic system using interferometric wavelength-shift detection, capable of multiplexing up to 32 fibre-optic Bragg grating strain and temperature sensors with identical characteristics, has been demonstrated. THS system is based on a spatially multiplexed scheme for use with fibre-based low-coherence interferometric sensors, reported previously. Four fibre-optic Bragg grating channels using the same fibre grating have been demonstrated for measuring quasi-static strain and temperature.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofElectronics Lettersen_US
dc.rights© IEEEen_US
dc.subjectBragg gratingsen_US
dc.subjectFiber opticsen_US
dc.subjectDiffraction gratingsen_US
dc.subjectMultiplexingen_US
dc.subjectInterferometryen_US
dc.titleSpatially-multiplexed fibre-optic bragg grating strain and temperature sensor system based on interferometric wavelength-shift detectionen_US
dc.typeArticleen_US
dc.collaborationUniversity of Kent at Canterburyen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.journalsSubscriptionen_US
dc.countryUnited Kingdomen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1049/el:19950670en_US
dc.dept.handle123456789/54en
dc.relation.issue12en_US
dc.relation.volume31en_US
cut.common.academicyear1995-1996en_US
dc.identifier.spage1009en_US
dc.identifier.epage1010en_US
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.languageiso639-1en-
item.fulltextNo Fulltext-
crisitem.journal.journalissn1350-911X-
crisitem.journal.publisherInstitute of Electrical Engineers-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0003-4541-092X-
crisitem.author.parentorgFaculty of Engineering and Technology-
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