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Title: Wear-aware adaptive routing for networks-on-chips
Authors: Vitkovskiy, Arseniy 
Soteriou, Vassos 
Gratz, Paul V. 
Keywords: Electromigration (EM);Hot-Carrier Injection (HCI);Lifetime;Network-on-chip;Reliability;Routing algorithm
Category: Electrical Engineering - Electronic Engineering - Information Engineering
Field: Engineering and Technology
Issue Date: 28-Sep-2015
Publisher: Association for Computing Machinery, Inc
Source: 9th IEEE/ACM International Symposium on Networks-on-Chip, NOCS 2015; Vancouver; Canada; 28- 30 September 2015
Conference: IEEE/ACM International Symposium on Networks-on-Chip, NOCS 
Abstract: Chip-multiprocessors are facing worsening reliability due to prolonged operational stresses, with their tile-interconnecting Network-on-Chip (NoC) being especially vulnerable to wearout-induced failure. To tackle this ominous threat we present a novel wear-aware routing algorithm that continuously considers the stresses the NoC experiences at runtime, along with temperature and fabrication process variation metrics, steering traffic away from locations that are most prone to Electromigration (EM)- and Hot-Carrier Injection (HCI)-induced wear. Under realistic applications our wear-aware algorithm yields 66% and 8% average increases in mean-time-to-failure for EM and HCI, respectively.
ISBN: 978-145033396-2
DOI: 10.1145/2786572.2786573
Rights: Copyright is held by the owner/author(s).
Type: Conference Papers
Appears in Collections:Δημοσιεύσεις σε συνέδρια/Conference papers

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