Please use this identifier to cite or link to this item: https://ktisis.cut.ac.cy/handle/10488/9241
Title: Baselines for lifetime of organic solar cells
Authors: Gevorgyan, Suren A. 
Espinosa, Nieves 
Ciammaruchi, Laura 
Roth B., Bérenger 
Livi, Francesco 
Tsopanidis, Stylianos 
Züfle, Simon 
Queirós, Sara 
Gregori, Alberto 
Benatto, Gisele Alves Dos Reis 
Corazza, Michael 
Madsen, Morten V. 
Hösel, Markus 
Beliatis, Michail J. 
Larsen-Olsen, Thue Trofod 
Pastorelli, Francesco 
Castro, António 
Mingorance, Alba 
Lenzi, Veniero 
Fluhr, Daniel 
Roesch, Roland 
Maria Duarte Ramos, Marta 
Savva, Achilleas 
Hoppe, Harald 
Marques, Luís Silvino Alves 
Burgués-Ceballos, Ignasi 
Georgiou, Efthymios 
Serrano-Luján, Lucia 
Krebs, Frederik C. 
Major Field of Science: Engineering and Technology
Field Category: Materials Engineering
Keywords: Degradation;Lifetime baseline;Lifetime database;Organic photovoltaics
Issue Date: 23-Nov-2016
Source: Advanced Energy Materials, 2016, vol. 6, no. 22
Volume: 6
Issue: 22
DOI: 10.1002/aenm.201600910
Journal: Advanced Energy Materials 
Abstract: The process of accurately gauging lifetime improvements in organic photovoltaics (OPVs) or other similar emerging technologies, such as perovskites solar cells is still a major challenge. The presented work is part of a larger effort of developing a worldwide database of lifetimes that can help establishing reference baselines of stability performance for OPVs and other emerging PV technologies, which can then be utilized for pass-fail testing standards and predicting tools. The study constitutes scanning of literature articles related to stability data of OPVs, reported until mid-2015 and collecting the reported data into a database. A generic lifetime marker is utilized for rating the stability of various reported devices. The collected data is combined with an earlier developed and reported database, which was based on articles reported until mid-2013. The extended database is utilized for establishing the baselines of lifetime for OPVs tested under different conditions. The work also provides the recent progress in stability of unencapsulated OPVs with different architectures, as well as presents the updated diagram of the reported record lifetimes of OPVs. The presented work is another step forward towards the development of pass-fail testing standards and lifetime prediction tools for emerging PV technologies.
ISSN: 1614-6832
DOI: 10.1002/aenm.201600910
Rights: © Wiley
Type: Article
Affiliation : Technical University of Denmark 
The Institute of Photonic Sciences 
University of Minho 
Zurich University of Applied Sciences 
Fluxim AG 
Université de Pau et des Pays de l'Adour 
Catalan Institute of Nanoscience and Nanotechnology 
Barcelona Institute of Science and Technology 
Technische Universität Ilmenau 
Cyprus University of Technology 
Imperial College London 
Friedrich-Schiller-University 
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