Please use this identifier to cite or link to this item:
Title: Baselines for lifetime of organic solar cells
Authors: Gevorgyan, Suren A. 
Espinosa, Nieves 
Ciammaruchi, Laura 
Roth B., Bérenger 
Livi, Francesco 
Tsopanidis, Stylianos 
Züfle, Simon 
Queirós, Sara 
Gregori, Alberto 
Benatto, Gisele Alves Dos Reis 
Corazza, Michael 
Madsen, Morten V. 
Hösel, Markus 
Beliatis, Michail J. 
Larsen-Olsen, Thue Trofod 
Pastorelli, Francesco 
Castro, António 
Mingorance, Alba 
Lenzi, Veniero 
Fluhr, Daniel 
Roesch, Roland 
Maria Duarte Ramos, Marta 
Savva, Achilleas 
Hoppe, Harald 
Marques, Luís Silvino Alves 
Burgués-Ceballos, Ignasi 
Georgiou, Efthymios 
Serrano-Luján, Lucia 
Krebs, Frederik C. 
Keywords: Degradation;Lifetime baseline;Lifetime database;Organic photovoltaics
Category: Materials Engineering
Field: Engineering and Technology
Issue Date: 23-Nov-2016
Publisher: Wiley-VCH Verlag
Source: Advanced Energy Materials, 2016, Volume 6, Issue 22, Article number 1600910
DOI: 10.1002/aenm.201600910
Abstract: The process of accurately gauging lifetime improvements in organic photovoltaics (OPVs) or other similar emerging technologies, such as perovskites solar cells is still a major challenge. The presented work is part of a larger effort of developing a worldwide database of lifetimes that can help establishing reference baselines of stability performance for OPVs and other emerging PV technologies, which can then be utilized for pass-fail testing standards and predicting tools. The study constitutes scanning of literature articles related to stability data of OPVs, reported until mid-2015 and collecting the reported data into a database. A generic lifetime marker is utilized for rating the stability of various reported devices. The collected data is combined with an earlier developed and reported database, which was based on articles reported until mid-2013. The extended database is utilized for establishing the baselines of lifetime for OPVs tested under different conditions. The work also provides the recent progress in stability of unencapsulated OPVs with different architectures, as well as presents the updated diagram of the reported record lifetimes of OPVs. The presented work is another step forward towards the development of pass-fail testing standards and lifetime prediction tools for emerging PV technologies.
ISSN: 16146832
Rights: © 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Type: Article
Appears in Collections:Άρθρα/Articles

Show full item record

Page view(s) 5

Last Week
Last month
checked on Aug 18, 2019

Google ScholarTM


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.