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|Title:||Does microstructure matter for statistical nanoindentation techniques?||Authors:||Constantinides, Georgios
Ulm, Franz Josef
Jennings, Hamlin M.
Krakowiak, Konrad J.
Bobko, Christopher P.
Vliet, Krystyn J Van
|Keywords:||Microstructure;Statistical methods;Cement composites||Category:||Nano-technology||Field:||Engineering and Techology||Issue Date:||2010||Publisher:||Elsevier||Source:||Cement and Concrete Composites, 2010, Volume 32, Issue 1, Pages 92-99||Abstract:||In their paper, Trtik et al. (2009) identify spurious peaks in the application of statistical nanoindentation technique as a critical obstacle for mechanical phase identification. In this discussion, we show that Trtik et al.'s finding is a consequence of an unrealistic virtual 3-D checkerboard microstructure considered by the authors. These peaks are not a general feature of indentation on multiphase materials, nor can the presence of such peaks be attributed to an intrinsic shortcoming of the grid-indentation technique. We also show that the authors' assertion of the absence of homogeneous material regions extending beyond 3 μm in cementitious materials is groundless.||URI:||http://ktisis.cut.ac.cy/handle/10488/7756||ISSN:||09589465||DOI:||http://dx.doi.org/10.1016/j.cemconcomp.2009.08.007||Rights:||© Elsevier||Type:||Article|
|Appears in Collections:||Άρθρα/Articles|
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