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|Title:||Photomodulated thermoreflectance detection of hydrogen gas using optically thin palladium film on silicon oxide||Authors:||Kalli, Kyriacos
Othonos, Andreas S.
|Keywords:||Photothermal spectroscopy;Palladium;Hydrogen;Chemisorption;Silicon oxide||Category:||Physical Sciences||Field:||Engineering and Technology||Issue Date:||Mar-1998||Publisher:||AIP American Institute of Physics Inc.||Source:||Review of Scientific Instruments,1998, vol. 69, no. 3, pp. 1505-1511||Journal:||Review of Scientific Instruments||Abstract:||The sensitivity of various thicknesses of optically thin film palladium layers evaporated onto silicon oxide substrate is investigated in the presence of a hydrogen/air atmosphere at room temperature. The magnitude of the resulting reflectivity change is measured using an excite-probe technique, through laser excited photothermal modulation of a probe beam. This allows for the recovery of information from both the amplitude and phase channels of the hydrogen sensor output. Data indicates that concentrations of 0.1% hydrogen in the presence of a balanced air mixture and at room temperature may be measured with an 8 nm palladium film. The presence of inhomogeneities in the palladium layers leads to anomalous behavior.||ISSN:||0034-6748||DOI:||10.1063/1.1148787||Rights:||© 1998 American Institute of Physics.||Type:||Article|
|Appears in Collections:||Άρθρα/Articles|
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