Please use this identifier to cite or link to this item:
|Title:||Structure, stability and bonding of ternary transition metal nitrides||Authors:||Matenoglou, G. M.
Koutsokeras, Loukas E.
Lekka, Christina E.
Evangelakis, Georgios Antomiou
Patsalas, Panos A.
|Major Field of Science:||Engineering and Technology||Field Category:||Materials Engineering||Keywords:||Ternary nitrides;Structure;Bonding;Stress;X-Ray diffraction;ab initio calculations||Issue Date:||25-Dec-2009||Source:||Surface and Coatings Technology, 2009, vol. 204, no. 6–7, pp. 911–914||Volume:||204||Issue:||6–7||Start page:||911||End page:||914||Journal:||Surface and Coatings Technology||Abstract:||Ternary transition metal nitrides have gained special attention in an effort to improve further the properties of the corresponding binary compounds. In this work, we present a comparative study of a very wide range of ternary transition metal nitrides of the form: TixMe1-xN and TaxMe1-xN (Me = Ti,Zr,Hf,Nb,Ta,Mo,W) over the whole x range (0 < x < 1) grown by Pulsed Laser Deposition (PLD) and by Dual Ion Beam Sputtering. We study the stability of the rocksalt structure in all these films experimentally and theoretically through ab-initio calculations. We investigate the validity of Vegard's rule and the effect of growth-dependent stresses to the lattice constant||URI:||http://ktisis.cut.ac.cy/handle/10488/7367||ISSN:||0257-8972||DOI:||10.1016/j.surfcoat.2009.06.032||Rights:||© Elsevier||Type:||Article||Affiliation:||University of Ioannina||Affiliation :||University of Ioannina
Université de Poitiers-CNRS
|Appears in Collections:||Άρθρα/Articles|
checked on Jun 15, 2021
WEB OF SCIENCETM
checked on Apr 22, 2021
checked on Jun 16, 2021
Items in KTISIS are protected by copyright, with all rights reserved, unless otherwise indicated.