Please use this identifier to cite or link to this item: https://ktisis.cut.ac.cy/handle/10488/7334
DC FieldValueLanguage
dc.contributor.authorKalli, Kyriacos-
dc.contributor.authorSimpson, George D.-
dc.contributor.authorZhou, Kaiming-
dc.contributor.authorZhang, Lin-
dc.contributor.authorBennion, Ian-
dc.contributor.otherΚαλλή, Κυριάκος-
dc.date.accessioned2013-02-21T13:56:46Zen
dc.date.accessioned2013-05-17T05:22:40Z-
dc.date.accessioned2015-12-02T10:00:10Z-
dc.date.available2013-02-21T13:56:46Zen
dc.date.available2013-05-17T05:22:40Z-
dc.date.available2015-12-02T10:00:10Z-
dc.date.issued2004-08-
dc.identifier.citationMeasurement Science and Technology,2004, vol.15, no.8, pp.1665-1669en_US
dc.identifier.issn0957-0233 (print)-
dc.identifier.issn1361-6501 (online)-
dc.description.abstractWe demonstrate an idealized method for the fabrication of regenerated type IA fibre Bragg gratings using commonly available apparatus. We use this technique to show that gratings written in the same fibre with the same period may have central wavelengths which are 14.4 nm apart and have an + 11.5% and - 1.2% difference in temperature and strain coefficients, respectively. We use these results to show that temperature compensated dual grating sensor heads, of an arbitrary length, may be quickly and consistently manufactured.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.publisherIop Scienceen
dc.relation.ispartofMeasurement Science and Technologyen_US
dc.rights© 2004 IOP Publishing Ltd.en_US
dc.subjectBragg gratingsen_US
dc.subjectOptical fibersen_US
dc.subjectFibersen_US
dc.titleBlank beam fabrication of regenerated type ia gratingsen_US
dc.typeArticleen_US
dc.collaborationHigher Technical Institute Cyprusen_US
dc.collaborationAston Universityen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.journalsSubscription Journalen_US
dc.countryUnited Kingdomen_US
dc.countryCyprusen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1088/0957-0233/15/8/040en_US
dc.dept.handle123456789/54en
cut.common.academicyear2003-2004en_US
item.grantfulltextnone-
item.fulltextNo Fulltext-
item.languageiso639-1other-
crisitem.journal.journalissn1361-6501-
crisitem.journal.publisherIOP-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.parentorgFaculty of Engineering and Technology-
Appears in Collections:Άρθρα/Articles
Show simple item record

SCOPUSTM   
Citations

23
checked on Dec 17, 2018

WEB OF SCIENCETM
Citations

15
checked on Sep 14, 2019

Page view(s)

85
Last Week
1
Last month
5
checked on Sep 17, 2019

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.