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|Title:||A method for the precise measurement of the difference between two low frequencies||Authors:||Kasparis, Takis
Voulgaris, Nicholas C.
Halkias, Christos C.
|Keywords:||Electronic circuits;Counting;Signal processing;Electric measurements||Category:||Electrical Engineering - Electronic Engineering - Information Engineering||Field:||Engineering and Technology||Issue Date:||1985||Publisher:||IEEE||Source:||IEEE Transactions on Instrumentation and Measurement, March 1985, vol. IM-34, no. 1||Conference:||Transactions on Instrumentation and Measurement||Abstract:||A method is presented for measuring the difference between two low frequencies with high resolution. The method is based on multiplying the two incoming frequencies by a large factor and then using a BCD up/down counter to store and display the resulting frequency difference.||URI:||http://ktisis.cut.ac.cy/handle/10488/7227||ISSN:||0018-9456||DOI:||10.1109/TIM.1985.4315268||Rights:||© 1985 IEEE||Type:||Article|
|Appears in Collections:||Άρθρα/Articles|
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