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Title: A modified domain deformation theory on 1-D signal classification
Authors: Kim, Sung S. 
Kasparis, Takis 
Keywords: Signal processing;Equations;Length measurement;Pattern recognition systems;Signal generators
Category: Electrical Engineering - Electronic Engineering - Information Engineering
Field: Engineering and Technology
Issue Date: May-1998
Publisher: IEEE
Source: IEEE Signal Processing Letters, 1998, vol. 5, no. 5, pp. 118-120
Journal: IEEE Signal Processing Letters 
Abstract: In this paper, classification of one-dimensional (1-D) signals is accomplished using domain deformation theory. We use a metric defined on a domain deformation for measuring the distance between signals. By introducing a newly defined metric space, the assumption that domain deformation is applicable only to continuous signals is removed such that any kind of integrable signal can be classified. This method also has an advantage over the L2 metric, because the similarity of one-dimensional signals can be better measured for the purpose of classification.
ISSN: 1070-9908
DOI: 10.1109/97.668949
Rights: © 1998 IEEE
Type: Article
Appears in Collections:Άρθρα/Articles

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