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|Title:||Detection of asphalt pavement cracks using remote sensing techniques||Authors:||Mettas, Christodoulos
Hadjimitsis, Diofantos G.
|Keywords:||Asphalt pavements;Pavement management;Remote Sensing;Separability Indices;Spectral Library;Spectral Signatures||Category:||Civil Engineering||Field:||Engineering and Technology||Issue Date:||26-Sep-2016||Source:||Conference on Remote Sensing Technologies and Applications for Urban Environments, Edinburgh, United Kingdom, 26 September 2016 through 27 September 2016||Conference:||Conference on Remote Sensing Technologies and Applications for Urban Environments||Abstract:||© 2016 SPIE. Deterioration of asphalt road pavements is inevitable throughout its life cycle. There are several types of deterioration that take place on these surfaces, like surface defects and deformations. One of the most common asphalt defects is cracking. Fatigue, transverse, longitudinal, reflective, edge, block and slippage are types of cracking that can be observed anywhere in the world. Monitoring and preventative/periodic maintenance of these types of wears are two very important actions that have to take place to avoid "costly" solutions. This paper aims to introduce the spectral characteristics of uncracked (healthy) and cracked asphalt surfaces which can give a new asphalt crack index. This is performed through remote sensing applications in the area of asphalt pavements. Multispectral images can be elaborated using the index to enhance crack marks on asphalt surfaces. Ground spectral signatures were acquired from both uncracked and cracked asphalted areas of Cyprus (Limassol). Evaluation separability indices can be used to identify the optimum wavelength regions that can distinguish better the uncracked and cracked asphalt surfaces. The results revealed that the spectral sensitivity for the enhancement of cracked asphalt was detected using the Euclidean, Mahalanobis and Cosine Distance Indices in the Vis range (approximately at 450 nm) and in the SWIR 1 range (approximately at 1750 nm).||Description:||Proceedings of SPIE - The International Society for Optical Engineering, Volume 10008, 2016, Article number 100080W||URI:||https://ktisis.cut.ac.cy/handle/10488/14246||ISBN:||978-151060420-9||ISSN:||0277786X||DOI:||10.1117/12.2240682||Type:||Conference Papers|
|Appears in Collections:||Δημοσιεύσεις σε συνέδρια/Conference papers|
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