Please use this identifier to cite or link to this item: https://ktisis.cut.ac.cy/handle/10488/10954
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dc.contributor.authorMarangos, Orestes-
dc.contributor.authorMisra, Anil S.-
dc.date.accessioned2018-04-19T09:57:45Z-
dc.date.available2018-04-19T09:57:45Z-
dc.date.issued2018-09-
dc.identifier.citationContinuum Mechanics and Thermodynamics, 2018, Volume 30, Issue 5, Pages 953-976en_US
dc.identifier.issn09351175-
dc.identifier.urihttp://ktisis.cut.ac.cy/handle/10488/10954-
dc.description.abstractScanning acoustic microscopy (SAM) has been applied to measure the near-surface elastic properties of materials. For many substrates, the near-surface property is not constant but varies with depth. In this paper, we aim to interpret the SAM data from such substrates by modeling the interaction of the focused ultrasonic field with a substrate having a near-surface graded layer. The focused ultrasonic field solutions were represented as spherical harmonic expansions while the substrate solutions were represented as plane wave expansions. The bridging of the two solutions was achieved through the decomposition of the ultrasonic pressure fields in their angular spectra. Parametric studies were performed, which showed that near-surface graded layers exhibit distinctive frequency dependence of their reflectance functions. This behavior is characteristic to the material property gradation profile as well as the extent of the property gradation. The developed model was used to explain the frequency-dependent reflection coefficients measured from an acid-etched dentin substrate. Based on the model calculations, the elastic property variations of the acid-etched dentin near-surface indicate that the topmost part of the etched layer is very soft (3–6 GPa) and transitions to the native dentin through a depth of 27 and 36 microns.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.publisherSpringer New York LLCen_US
dc.rights© 2018 Springer-Verlag GmbH Germanyen_US
dc.subjectAcoustic microscopyen_US
dc.subjectFocused ultrasonic fielden_US
dc.subjectFrequency dependenceen_US
dc.subjectNear-surface graded elasticityen_US
dc.subjectReflectance functionen_US
dc.titleModeling micromechanical measurements of depth-varying properties with scanning acoustic microscopyen_US
dc.typeArticleen_US
dc.collaborationCyprus University of Technologyen_US
dc.collaborationUniversity of Kansasen_US
dc.subject.categoryMaterials Engineeringen_US
dc.journalsSubscription Journalen_US
dc.countryCyprusen_US
dc.countryUnited Statesen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1007/s00161-018-0625-yen_US
cut.common.academicyear2018-2019en_US
item.grantfulltextnone-
item.fulltextNo Fulltext-
item.languageiso639-1other-
crisitem.author.deptDepartment of Civil Engineering and Geomatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.parentorgFaculty of Engineering and Technology-
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