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Πεδίο DCΤιμήΓλώσσα
dc.contributor.authorHadjimitsis, Diofantos G.-
dc.contributor.authorPapadavid, George-
dc.contributor.authorToulios, Leonidas-
dc.date.accessioned2012-10-23T09:35:59Zen
dc.date.accessioned2013-05-17T10:30:54Z-
dc.date.accessioned2015-12-09T13:52:05Z-
dc.date.available2012-10-23T09:35:59Zen
dc.date.available2013-05-17T10:30:54Z-
dc.date.available2015-12-09T13:52:05Z-
dc.date.issued2011-
dc.identifier.citationJournal of Applied Remote Sensing, 2011, vol. 5 , no. 1en_US
dc.identifier.issn19313195-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/4508-
dc.description.abstractThis paper aims to model leaf area index (LAI) and crop height to spectral vegetation indices (VI), such as normalized difference vegetation index (NDVI) and soil adjusted vegetation index (SAVI), and weighted difference vegetation index (WDVI). The intended purpose is to create empirical statistical models to support evapotranspiration algorithms applied under the current conditions in the island of Cyprus. Indeed, a traditionally agricultural area was selected in the Mandria Village in the Paphos District area in Cyprus, where one of the island's main exported crops, potatoes, are cultivated. A GER-1500 field spectroradiometer was used in this study in order to retrieve the necessary spectrum data of the different crops for estimating the VI’s. A field campaign was undertaken with spectral measurements of LAI and crop height using the Sun-Scan canopy analyzer, acquired simultaneously with the spectroradiometric measurements between March and April of 2008 and 2009. Regarding the measurements, the phenological cycle of potatoes was followed. Several regression models have been applied to relate LAI/crop height and the three indices. It was found that the best fitted vegetation index to both LAI and crop height was WDVI. When LAI was regressed against WDVI for potatoes, the determination coefficient (R2) was 0.72, while for crop height R2 reached 0.78. Two Landsat TM-5 images acquired simultaneously during the spectroradiometric and LAI and crop height measurements are used to validate the proposed regression model. From the whole analysis it was found that the modeled results are very close to real values. This fact enables the specific empirical models to be used in the future for hydrological purposes.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofJournal of Applied Remote Sensingen_US
dc.rights© SPIEen_US
dc.subjectCrop Heighten_US
dc.subjectField spectroscopyen_US
dc.subjectLeaf area indexen_US
dc.subjectModelingen_US
dc.subjectSpectral vegetation indicesen_US
dc.titleMapping potato crop height and leaf area index through vegetation indices using remote sensing in Cyprusen_US
dc.typeArticleen_US
dc.collaborationCyprus University of Technologyen_US
dc.collaborationAgricultural Research Institute of Cyprusen_US
dc.collaborationNAGREFen_US
dc.collaborationMeteorological Service of Cyprusen_US
dc.subject.categoryEnvironmental Engineeringen_US
dc.journalsSubscriptionen_US
dc.reviewpeer reviewed-
dc.countryGreeceen_US
dc.countryCyprusen_US
dc.description.noteThe authors would like to express their appreciation to Cyprus Research Promotion Foundation (www.research.org.cy), European Union (Regional Development Funds), and the Cyprus University of Technology for their funding support. Thanks are given to the Remote Sensing Laboratory of the Department of Civil Engineering and Geomatics at the Cyprus University of Technology-
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1117/1.3596388en_US
dc.dept.handle123456789/148en
dc.relation.issue1en_US
dc.relation.volume5en_US
cut.common.academicyear2010-2011en_US
item.fulltextNo Fulltext-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
item.languageiso639-1en-
crisitem.author.deptDepartment of Civil Engineering and Geomatics-
crisitem.author.deptDepartment of Civil Engineering and Geomatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-2684-547X-
crisitem.author.orcid0000-0002-6102-1732-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.author.parentorgFaculty of Engineering and Technology-
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