Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/4349
DC FieldValueLanguage
dc.contributor.authorLeontiou, Theodoros-
dc.contributor.authorTersoff, Jerry-
dc.contributor.authorKelires, Pantelis C.-
dc.date.accessioned2013-03-05T10:25:13Zen
dc.date.accessioned2013-05-17T10:30:30Z-
dc.date.accessioned2015-12-09T12:07:56Z-
dc.date.available2013-03-05T10:25:13Zen
dc.date.available2013-05-17T10:30:30Z-
dc.date.available2015-12-09T12:07:56Z-
dc.date.issued2010-12-03-
dc.identifier.citationPhysical Review Letters, 2010, vol. 105, no. 23en_US
dc.identifier.issn10797114-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/4349-
dc.description.abstractMisfit strain plays a crucial role in semiconductor heteroepitaxy, driving alloy intermixing or the introduction of dislocations. Here we predict a strong coupling between these two modes of strain relaxation, with unexpected consequences. Specifically, strain relaxation by dislocations can suppress intermixing between the heterolayer and the substrate. Monte Carlo simulations and continuum modeling show that the suppression, though not absolute, can be surprisingly large, even at high temperatures. The effect is strongest for a large misfit (e.g., InAs on GaAs) or for thin substrates (e.g., Ge on silicon on insulator).en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofPhysical Review Lettersen_US
dc.rights© The American Physical Societyen_US
dc.subjectComputer simulationen_US
dc.subjectContinuum mechanicsen_US
dc.subjectGermaniumen_US
dc.subjectIndium arsenideen_US
dc.subjectGallium alloysen_US
dc.titleSuppression of intermixing in strain-relaxed epitaxial layersen_US
dc.typeArticleen_US
dc.collaborationCyprus University of Technologyen_US
dc.collaborationT.J. Watson Research Centeren_US
dc.journalsSubscriptionen_US
dc.reviewpeer reviewed-
dc.countryCyprusen_US
dc.countryUnited Statesen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1103/PhysRevLett.105.236104en_US
dc.dept.handle123456789/141en
dc.relation.issue23en_US
dc.relation.volume105en_US
cut.common.academicyear2010-2011en_US
item.fulltextNo Fulltext-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
item.languageiso639-1en-
crisitem.journal.journalissn1079-7114-
crisitem.journal.publisherAmerican Physical Society-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-0268-259X-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.author.parentorgFaculty of Engineering and Technology-
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