Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/1858
DC FieldValueLanguage
dc.contributor.authorKim, Sung S.-
dc.contributor.authorKasparis, Takis-
dc.contributor.otherΚασπαρής, Τάκης-
dc.date.accessioned2013-02-18T13:16:17Zen
dc.date.accessioned2013-05-17T05:22:00Z-
dc.date.accessioned2015-12-02T09:50:25Z-
dc.date.available2013-02-18T13:16:17Zen
dc.date.available2013-05-17T05:22:00Z-
dc.date.available2015-12-02T09:50:25Z-
dc.date.issued1998-05-
dc.identifier.citationIEEE Signal Processing Letters, 1998, vol. 5, no. 5, pp. 118-120en_US
dc.identifier.issn10709908-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/1858-
dc.description.abstractIn this paper, classification of one-dimensional (1-D) signals is accomplished using domain deformation theory. We use a metric defined on a domain deformation for measuring the distance between signals. By introducing a newly defined metric space, the assumption that domain deformation is applicable only to continuous signals is removed such that any kind of integrable signal can be classified. This method also has an advantage over the L2 metric, because the similarity of one-dimensional signals can be better measured for the purpose of classification.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofIEEE Signal Processing Lettersen_US
dc.rights© IEEEen_US
dc.subjectSignal processingen_US
dc.subjectEquationsen_US
dc.subjectLength measurementen_US
dc.subjectPattern recognition systemsen_US
dc.subjectSignal generatorsen_US
dc.titleA modified domain deformation theory on 1-D signal classificationen_US
dc.typeArticleen_US
dc.collaborationUniversity of Central Floridaen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.journalsHybrid Open Accessen_US
dc.countryUnited Statesen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1109/97.668949en_US
dc.dept.handle123456789/54en
dc.relation.issue5en_US
dc.relation.volume5en_US
cut.common.academicyear1997-1998en_US
dc.identifier.spage118en_US
dc.identifier.epage120en_US
item.grantfulltextnone-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.languageiso639-1en-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0003-3486-538x-
crisitem.author.parentorgFaculty of Engineering and Technology-
Appears in Collections:Άρθρα/Articles
CORE Recommender
Show simple item record

SCOPUSTM   
Citations

2
checked on Nov 9, 2023

Page view(s)

428
Last Week
1
Last month
5
checked on Jun 1, 2024

Google ScholarTM

Check

Altmetric


Items in KTISIS are protected by copyright, with all rights reserved, unless otherwise indicated.