Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/18311
DC FieldValueLanguage
dc.contributor.authorSingh, Ranbir-
dc.contributor.authorGiussani, Ester-
dc.contributor.authorMróz, Marta M.-
dc.contributor.authorDi Fonzo, Fabio-
dc.contributor.authorFazzi, Daniele-
dc.contributor.authorCabanillas-González, Juan R.-
dc.contributor.authorOldridge, Luke-
dc.contributor.authorVaenas, Naoum-
dc.contributor.authorKontos, Athanassios G.-
dc.contributor.authorFalaras, Polycarpos-
dc.contributor.authorGrimsdale, Andrew C.-
dc.contributor.authorJacob, Josemon-
dc.contributor.authorMüllen, Klaus-
dc.contributor.authorKeivanidis, Panagiotis E.-
dc.date.accessioned2020-04-30T17:34:09Z-
dc.date.available2020-04-30T17:34:09Z-
dc.date.issued2014-07-
dc.identifier.citationOrganic Electronics, 2014, vol. 15, no. 7, pp. 1347-1361en_US
dc.identifier.issn15661199-
dc.description.abstractA model bulk-heterojunction of a perylene diimide (PDI) monomeric derivative is studied for interrogating the role of PDI aggregates in the photocurrent generation efficiency (ηPC) of PDI-based organic photovoltaic (OPV) devices. Blend films of the PDI derivative and the poly(indenofluorene) (PIF) polymer annealed between room temperature and 220 °C, are used as the photoactive layers for the fabrication of OPVs. The positive effect of thermal annealing is assigned to the evolution of PDI aggregates in the amorphous PIF matrix. Annealing increases the electron mobility by three orders of magnitude. In contrast, owned to the thermally inert PIF matrix used, hole mobility increases only by a factor of six. High resolution cross-sectional scanning electron microscopy suggests that ηPC in PDI-based OPVs is not limited by the PDI aggregates but by their improper alignment. In situ Raman spectra and density functional theory calculations identify a marker for monitoring the strength of π-π stacking interactions between PDI monomers. It s further demonstrated that the electron-collecting electrode of the PIF:PDI devices dictates their performance. The use of Al is found to impede charge extraction and this is attributed to an unidentified product of the reaction between PDI and Al that leads to the formation of an electron-blocking layer. Device performance rectifies when a Ca/Al electrode is used and the power conversion efficiency is increased by a factor of four. © 2014 Elsevier B.V. All rights reserved.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofOrganic Electronicsen_US
dc.rights© Elsevieren_US
dc.subjectNon-fullerene acceptorsen_US
dc.subjectPerylene diimideen_US
dc.subjectAggregationen_US
dc.subjectCharge transporten_US
dc.subjectMorphologyen_US
dc.subjectOrganic solar cellsen_US
dc.titleOn the role of aggregation effects in the performance of perylene-diimide based solar cellsen_US
dc.typeArticleen_US
dc.collaborationCentre for Nanoscience and Technology@PoliMien_US
dc.collaborationInstituto Madrileno de Estudios Avanzados en Nanocienciaen_US
dc.collaborationMax Planck Instituteen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.journalsSubscriptionen_US
dc.countryItalyen_US
dc.countrySpainen_US
dc.countryGermanyen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1016/j.orgel.2014.03.044en_US
dc.identifier.scopus2-s2.0-84899004034-
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/84899004034-
dc.relation.issue7en_US
dc.relation.volume15en_US
cut.common.academicyear2014-2015en_US
dc.identifier.spage1347en_US
dc.identifier.epage1361en_US
item.grantfulltextnone-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.languageiso639-1en-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-5336-249X-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.journal.journalissn1566-1199-
crisitem.journal.publisherElsevier-
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