Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/1696
DC FieldValueLanguage
dc.contributor.authorKelires, Pantelis C.-
dc.contributor.otherΚελίρης, Παντελής-
dc.date.accessioned2013-03-06T16:52:03Zen
dc.date.accessioned2013-05-17T05:22:18Z-
dc.date.accessioned2015-12-02T09:59:41Z-
dc.date.available2013-03-06T16:52:03Zen
dc.date.available2013-05-17T05:22:18Z-
dc.date.available2015-12-02T09:59:41Z-
dc.date.issued1994-
dc.identifier.citationPhysical Review B,1994, vol. 49, no. 16, pp. 11496-11499en_US
dc.identifier.issn01631829-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/1696-
dc.description.abstractUsing energies obtained from empirical-potential calculations, we study the relative stability between abrupt, ordered, and randomized interfaces in thin-layer superlattices. For most of the substrate parameter values, both ordered and randomized layers are more stable than the abrupt interface. The ordered geometries have even lower formation enthalpies than random structures. We examine the implications of these results in view of experimental studies of annealing and interdiffusion.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofPhysical review Ben_US
dc.rights© American Physical Societyen_US
dc.subjectEnergyen_US
dc.subjectEnthalpyen_US
dc.titleInterfacial stability and intermixing in thin-layer sin/gen superlatticesen_US
dc.typeArticleen_US
dc.affiliationUniversity of Creteen
dc.collaborationUniversity of Creteen_US
dc.journalsSubscriptionen_US
dc.countryGreeceen_US
dc.subject.fieldNatural Sciencesen_US
dc.identifier.doi10.1103/PhysRevB.49.11496en_US
dc.dept.handle123456789/54en
dc.relation.issue16en_US
dc.relation.volume49en_US
cut.common.academicyear1995-1996en_US
dc.identifier.spage11496en_US
dc.identifier.epage11499en_US
item.grantfulltextnone-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.languageiso639-1en-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-0268-259X-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.journal.journalissn2469-9969-
crisitem.journal.publisherAmerican Physical Society-
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