Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/13952
DC FieldValueLanguage
dc.contributor.authorMichaelides, Michalis P.-
dc.contributor.authorPanayiotou, Christos G.-
dc.date.accessioned2019-05-31T09:34:00Z-
dc.date.available2019-05-31T09:34:00Z-
dc.date.issued2008-09-30-
dc.identifier.citation2008 American Control Conference, ACC; Seattle, WA; United States; 11 June 2008 through 13 June 2008en_US
dc.identifier.isbn978-1-4244-2078-0-
dc.identifier.issn0743-1619-
dc.description.abstractThis paper investigates the use of wireless sensor networks for estimating the location of an event that emits a signal which propagates over a large region. In this context, we assume that the sensors make binary observations and report the event if the measured signal at their location is above a threshold; otherwise they remain silent. Based on the sensor binary beliefs we use 4 different estimators to localize the event: CE (Centroid Estimator), ML (Maximum Likelihood), SNAP (Subtract on Negative Add on Positive) and AP (Add on Positive). The main contribution of this paper is the fault tolerance analysis of the proposed estimators. Furthermore, the analysis shows that SNAP is the most fault tolerant of all estimators considered. ©2008 AACC.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.rights© IEEEen_US
dc.subjectFault toleranceen_US
dc.subjectWireless sensor networksen_US
dc.subjectMaximum likelihood estimationen_US
dc.subjectRobustnessen_US
dc.subjectSensor arraysen_US
dc.subjectMaximum likelihood detectionen_US
dc.subjectEvent detectionen_US
dc.subjectRadar trackingen_US
dc.subjectAcoustic applicationsen_US
dc.subjectWorking environment noiseen_US
dc.titleFault tolerant event localization in sensor networks using binary dataen_US
dc.typeConference Papersen_US
dc.collaborationUniversity of Cyprusen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.countryCyprusen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.relation.conferenceProceedings of the American Control Conferenceen_US
dc.identifier.doi10.1109/ACC.2008.4586977en_US
dc.identifier.scopus2-s2.0-52449096439en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/52449096439en
dc.contributor.orcid#NODATA#en
dc.contributor.orcid#NODATA#en
cut.common.academicyear2019-2020en_US
item.openairecristypehttp://purl.org/coar/resource_type/c_c94f-
item.grantfulltextnone-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.languageiso639-1en-
item.openairetypeconferenceObject-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-0549-704X-
crisitem.author.parentorgFaculty of Engineering and Technology-
Appears in Collections:Δημοσιεύσεις σε συνέδρια /Conference papers or poster or presentation
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