Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/13941
DC FieldValueLanguage
dc.contributor.authorKakarountas, Athanasios P.-
dc.contributor.authorGoutis, Costas E.-
dc.contributor.authorMichail, Harris-
dc.date.accessioned2019-05-31T09:29:26Z-
dc.date.available2019-05-31T09:29:26Z-
dc.date.issued2007-09-
dc.identifier.citationProceedings - 2007 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2007, Article no. 4449490, pp. 47-51; 2007 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2007 Rabat; Morocco; 2 September 2007 through 5 September 2007en_US
dc.identifier.isbn978-142441278-5-
dc.description.abstractIn this work, an IP infrastructure is presented that provides concurrent signature monitoring to the designed System-on-a-Chip (SoC). Such mechanisms ensure application code consistency and research focus integration inside high performance processor cores. A low-cost but very effective approach is offered, which has been successfully integrated in a prototype targeting safety critical applications. The advantages of the integration of this simple unit in a SoC and its characteristics are also presented. © 2007 IEEE.en_US
dc.description.sponsorshipST, Atmel,Altran Technologies, Alteraen_US
dc.language.isoenen_US
dc.rights© 2007 IEEEen_US
dc.subjectBISTen_US
dc.subjectDesign-for-testabilityen_US
dc.subjectOn-line testingen_US
dc.titleIntegration of a concurrent signature monitoring mechanism in a system-on-a-chipen_US
dc.typeConference Papersen_US
dc.collaborationUniversity of Patrasen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.countryGreeceen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.relation.conferenceInternational Conference on Design and Technology of Integrated Systems in Nanoscaleen_US
dc.identifier.doi10.1109/DTIS.2007.4449490en_US
dc.identifier.scopus2-s2.0-48349128515en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/48349128515en
dc.contributor.orcid#NODATA#en
dc.contributor.orcid#NODATA#en
dc.contributor.orcid#NODATA#en
cut.common.academicyear2007-2008en_US
item.fulltextNo Fulltext-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_c94f-
item.openairetypeconferenceObject-
item.languageiso639-1en-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-8299-8737-
crisitem.author.parentorgFaculty of Engineering and Technology-
Appears in Collections:Δημοσιεύσεις σε συνέδρια /Conference papers or poster or presentation
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