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https://hdl.handle.net/20.500.14279/13416
Πεδίο DC | Τιμή | Γλώσσα |
---|---|---|
dc.contributor.author | Mohanram, Sat | - |
dc.contributor.author | Darwish, Mohamed | - |
dc.contributor.author | Marouchos, Christos | - |
dc.contributor.other | Μαρούχος, Χρίστος | - |
dc.date.accessioned | 2019-04-02T08:54:48Z | - |
dc.date.available | 2019-04-02T08:54:48Z | - |
dc.date.issued | 2018-11 | - |
dc.identifier.citation | 53rd International Universities Power Engineering Conference, 2018, 4-7 September, Glasgow, United Kingdom; | en_US |
dc.identifier.uri | https://hdl.handle.net/20.500.14279/13416 | - |
dc.description.abstract | Semiconductor devices are subjected to elevated levels of stresses when used at high voltage high current and temperature applications. This stress is mainly due to hard switching which is proportional to the switching frequency. This paper presents methods used to remove this energy to prevent expensive switch damage due to overheating and high dv/dt oscillations. In confirmation of the research title, the process in the determination of 'RC' in snubber circuits has been proven by OrCAD optimisation and presented. | en_US |
dc.format | en_US | |
dc.language.iso | en | en_US |
dc.rights | © 2018 IEEE. | en_US |
dc.subject | Hard switching | en_US |
dc.subject | Input-output parameters | en_US |
dc.subject | Simulation | en_US |
dc.subject | Snubber Circuit (RC) | en_US |
dc.subject | Switching frequency | en_US |
dc.subject | Losses | en_US |
dc.subject | TC Optimizations | en_US |
dc.title | Optimisation and Simulation of RC Time Constants in Snubber Circuits | en_US |
dc.type | Conference Papers | en_US |
dc.collaboration | Brunel University | en_US |
dc.collaboration | Cyprus University of Technology | en_US |
dc.subject.category | Electrical Engineering - Electronic Engineering - Information Engineering | en_US |
dc.country | Cyprus | en_US |
dc.country | United Kingdom | en_US |
dc.subject.field | Engineering and Technology | en_US |
dc.relation.conference | International Universities Power Engineering Conference | en_US |
dc.identifier.doi | 10.1109/UPEC.2018.8542111 | en_US |
cut.common.academicyear | 2018-2019 | en_US |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
item.fulltext | No Fulltext | - |
item.languageiso639-1 | en | - |
item.openairecristype | http://purl.org/coar/resource_type/c_c94f | - |
item.openairetype | conferenceObject | - |
crisitem.author.dept | Department of Electrical Engineering, Computer Engineering and Informatics | - |
crisitem.author.faculty | Faculty of Engineering and Technology | - |
crisitem.author.parentorg | Faculty of Engineering and Technology | - |
Εμφανίζεται στις συλλογές: | Δημοσιεύσεις σε συνέδρια /Conference papers or poster or presentation |
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