Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/13412
DC FieldValueLanguage
dc.contributor.authorTheodosiou, Antreas-
dc.contributor.authorFokine, Michael-
dc.contributor.authorHawkins, Thomas W.-
dc.contributor.authorBallato, John M.-
dc.contributor.authorGibson, Ursula J.-
dc.contributor.authorKalli, Kyriacos-
dc.date.accessioned2019-03-31T19:49:42Z-
dc.date.available2019-03-31T19:49:42Z-
dc.date.issued2018-11-29-
dc.identifier.citationElectronics Letters, 2018, vol. 54, no. 24, pp. 1393-1395en_US
dc.identifier.issn1350911X-
dc.description.abstractFibre Bragg grating inscription in the crystalline silicon (Si)-core fibre is described using visible light femtosecond laser pulses. The femtosecond pulses at 517 nm propagate through the transparent silica glass cladding and are fully absorbed by the Si core generating locally high temperatures and stress fields in forming the grating periods. The Si FBGs were characterised in reflection, calibrated for a first time as strain and temperature sensors and compared with that of FBGs inscribed in standard silica fibres.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofElectronics Lettersen_US
dc.rights© The Institution of Engineering and Technologyen_US
dc.subjectCladding (coating)en_US
dc.subjectElectromagnetic pulseen_US
dc.subjectFiber Bragg gratingsen_US
dc.subjectFibersen_US
dc.subjectInfrared devicesen_US
dc.subjectLaser pulsesen_US
dc.subjectSilicaen_US
dc.subjectSiliconen_US
dc.titleCharacterisation of silicon fibre Bragg grating in near-infrared band for strain and temperature sensingen_US
dc.typeArticleen_US
dc.collaborationCyprus University of Technologyen_US
dc.collaborationKTH Royal Institute of Technologyen_US
dc.collaborationClemson Universityen_US
dc.collaborationNorwegian University of Science and Technologyen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.journalsSubscriptionen_US
dc.countryCyprusen_US
dc.countrySwedenen_US
dc.countryUnited Statesen_US
dc.countryNorwayen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1049/el.2018.6529en_US
dc.relation.issue24en_US
dc.relation.volume54en_US
cut.common.academicyear2018-2019en_US
dc.identifier.spage1393en_US
dc.identifier.epage1395en_US
item.fulltextNo Fulltext-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
item.languageiso639-1en-
crisitem.journal.journalissn1350-911X-
crisitem.journal.publisherInstitute of Electrical Engineers-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-5912-9138-
crisitem.author.orcid0000-0003-4541-092X-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.author.parentorgFaculty of Engineering and Technology-
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