Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/13407
DC FieldValueLanguage
dc.contributor.authorKeivanidis, Panagiotis E.-
dc.contributor.authorKhan, Jafar I.-
dc.contributor.authorKatzenmeier, Leon-
dc.contributor.authorKan, Zhipeng-
dc.contributor.authorLimbu, Saurav-
dc.contributor.authorConstantinou, Marios-
dc.contributor.authorLariou, Eirini-
dc.contributor.authorConstantinides, Georgios-
dc.contributor.authorHayes, Sophia C.-
dc.contributor.authorKim, Ji-Seon-
dc.contributor.authorLaquai, Frédéric-
dc.date.accessioned2019-03-31T07:28:38Z-
dc.date.available2019-03-31T07:28:38Z-
dc.date.issued2018-12-27-
dc.identifier.citationThe Journal of Physical Chemistry C, 2018, vol. 122, no. 51, pp. 29141-29149en_US
dc.identifier.issn19327447-
dc.description.abstractThe formation of different types of structural polymorphs of poly(3-hexyl-thiophene) (P3HT) affects the performance of organic photovoltaic (OPV) devices that use thermally annealed P3HT:PCBM[60] blend films as a photoactive layer. Here it is demonstrated that when densely packed and nondensely packed P3HT polymorphs coexist in the P3HT:PCBM[60] layer, nongeminate charge recombination is fast; however, in a device nongeminate recombination is effectively overruled by efficient and fast charge carrier extraction. In stark contrast, when only a less densely packed P3HT polymorph is present in the blend, nongeminate charge recombination losses are less pronounced, and the charge carrier extraction efficiency is lower. The antagonistic nongeminate charge recombination and charge carrier extraction processes in these systems are monitored by time-delayed collection field (TDCF) and ultrafast transient absorption (TA) experiments. Furthermore, resonance Raman spectroscopy reveals that in the absence of the densely packed P3HT polymorph the energetic disorder present in the P3HT:PCBM[60] blend is higher. High-resolution atomic force microscopy imaging further identifies pronounced differences in the layer morphology when the polymorph distribution varies between unimodal and bimodal. These results indicate that less densely packed P3HT polymorphs increase disorder and impede charge collection, leading to a reduction of the device fill factor.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofThe Journal of Physical Chemistry Cen_US
dc.rights© American Chemical Society.en_US
dc.subjectAtomic force microscopyen_US
dc.subjectCharge carriersen_US
dc.subjectPoly-3-hexylthiopheneen_US
dc.subjectPolymorphismen_US
dc.subjectPhotovoltaicen_US
dc.titleImpact of Structural Polymorphs on Charge Collection and Nongeminate Recombination in Organic Photovoltaic Devicesen_US
dc.typeArticleen_US
dc.collaborationCyprus University of Technologyen_US
dc.collaborationKing Abdullah University of Science and Technologyen_US
dc.collaborationImperial College Londonen_US
dc.collaborationUniversity of Cyprusen_US
dc.subject.categoryEnvironmental Engineeringen_US
dc.journalsSubscriptionen_US
dc.countryCyprusen_US
dc.countrySaudi Arabiaen_US
dc.countryUnited Kingdomen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1021/acs.jpcc.8b09825en_US
dc.relation.issue51en_US
dc.relation.volume122en_US
cut.common.academicyear2018-2019en_US
dc.identifier.spage29141en_US
dc.identifier.epage29149en_US
item.fulltextNo Fulltext-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
item.languageiso639-1en-
crisitem.journal.journalissn1932-7455-
crisitem.journal.publisherAmerican Chemical Society-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-5336-249X-
crisitem.author.orcid0000-0003-1979-5176-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.author.parentorgFaculty of Engineering and Technology-
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