Please use this identifier to cite or link to this item: http://ktisis.cut.ac.cy/handle/10488/7756
Title: Does microstructure matter for statistical nanoindentation techniques?
Authors: Constantinides, Georgios 
Ulm, Franz Josef 
Vandamme, Matthieu 
Jennings, Hamlin M. 
Vanzo, James 
Bentivegna, Michelle 
Krakowiak, Konrad J. 
Bobko, Christopher P. 
Vliet, Krystyn J Van 
Keywords: Microstructure;Statistical methods;Cement composites
Category: Nano-technology
Field: Engineering and Techology
Issue Date: 2010
Publisher: Elsevier
Source: Cement and Concrete Composites, 2010, Volume 32, Issue 1, Pages 92-99
Abstract: In their paper, Trtik et al. (2009) identify spurious peaks in the application of statistical nanoindentation technique as a critical obstacle for mechanical phase identification. In this discussion, we show that Trtik et al.'s finding is a consequence of an unrealistic virtual 3-D checkerboard microstructure considered by the authors. These peaks are not a general feature of indentation on multiphase materials, nor can the presence of such peaks be attributed to an intrinsic shortcoming of the grid-indentation technique. We also show that the authors' assertion of the absence of homogeneous material regions extending beyond 3 μm in cementitious materials is groundless.
URI: http://ktisis.cut.ac.cy/handle/10488/7756
ISSN: 09589465
DOI: http://dx.doi.org/10.1016/j.cemconcomp.2009.08.007
Rights: © Elsevier
Type: Article
Appears in Collections:Άρθρα/Articles

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