Please use this identifier to cite or link to this item: http://ktisis.cut.ac.cy/handle/10488/7677
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dc.contributor.authorChoulis, Stelios A.en,el
dc.contributor.authorHosea, Thomas Jeff Cockburnen,el
dc.contributor.authorTomić, Stanko S.en,el
dc.contributor.otherΧούλης, Στέλιος Α.-
dc.date.accessioned2013-03-06T15:41:43Zen,el
dc.date.accessioned2013-05-17T05:22:59Z-
dc.date.accessioned2015-12-02T10:13:31Z-
dc.date.available2013-03-06T15:41:43Zen,el
dc.date.available2013-05-17T05:22:59Z-
dc.date.available2015-12-02T10:13:31Z-
dc.date.issued2002en,el
dc.identifier.citationPhysical review B - Condensed matter and materials physics, 2002, Volume 66, Issue 16, Pages 1-9en,el
dc.identifier.issn1098-0121en,el
dc.identifier.urihttp://ktisis.cut.ac.cy/handle/10488/7677en,el
dc.description.abstractWe report photomodulated reflectance measurements of several intersubband transitions for a series of as-grown InyGa1-yAs1-xNx/GaAs multiple quantum well samples as functions of hydrostatic pressure (at room temperature) and temperature (at ambient pressure). The experimental results provide support for the effects of disorder due to different nearest-neighbor N-cation configurations. The quantum well transition energies obtained from the photomodulated reflectance spectra are fitted as a function of pressure with a realistic 10 band k⋅p Hamiltonian, that includes tight-binding-based energies and coupling parameters for the N levels. The quality of match between theory and experiment confirms the theoretical model and predicts some important material parameters for dilute-N InGaAsN alloysen,el
dc.language.isoenen,el
dc.publisherAmerican Physical Societyen,el
dc.rights© 2002 The American Physical Societyen,el
dc.subjectQuantum wellsen,el
dc.subjectGalliumen,el
dc.subjectIndiumen,el
dc.subjectHydrostatic pressureen,el
dc.titleElectronic structure of InyGa1-yAs1-xNx/GaAs multiple quantum wells in the dilute-N regime from pressure and k⋅p studiesen,el
dc.typeArticleen,el
dc.affiliationUniversity of Surreyen,el
dc.identifier.doi10.1103/PhysRevB.66.165321en,el
dc.dept.handle123456789/54en
item.grantfulltextnone-
item.fulltextNo Fulltext-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.facultyFaculty of Engineering and Technology-
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