Please use this identifier to cite or link to this item: http://ktisis.cut.ac.cy/handle/10488/7557
Title: Correlation between thickness, conductivity and thermal degradation mechanisms of PEDOT:PSS films
Authors: Choulis, Stelios A. 
Vitoratos, Evangelos G. 
Sakkopoulos, Sotirios A. 
Dalas, Evangelos 
Paliatsas, N. 
Emmanouil, Konstantinos 
Malkaj, Partizan 
Keywords: Conducting polymers
Solar cells
metadata.dc.subject.category: Mechanical Engineering
metadata.dc.subject.field: Engineering and Technology
Issue Date: 2009
Publisher: American Institute of Physics
Source: Organized by the hellenic psysical society with cooperation of the psysics departments of universities in Greece: 7th international conference of the balkan physical union, Volume 1203, Pages 178-181
Abstract: D.c. conductivity σ and thermal degradation measurements on PEDOT:PSS films of different thicknesses d  =  50, 120 and 180 nm are reported. The experimental results are consistent with a hopping type carrier transport. For the films with thickness d  =  50 nm, which consist of almost one single layer of PEDOT:PSS conductive grains, the conductivity and the heat aging are consistent with a hopping transport in a granular metal type structure. However, for films with d  =  120 and 180 nm, in which many conductive grains constitute the film thickness, a completely different behaviour is exhibited. An explanation of this is proposed
URI: http://ktisis.cut.ac.cy/handle/10488/7557
ISBN: 978-0-7354-0740-4
DOI: 10.1063/1.3322407
Rights: © 2010 American Institute of Physics
metadata.dc.type: Book Chapter
Appears in Collections:Κεφάλαια βιβλίων/Book chapters

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