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|Title:||Correlation between thickness, conductivity and thermal degradation mechanisms of PEDOT:PSS films||Authors:||Choulis, Stelios A.
Vitoratos, Evangelos G.
Sakkopoulos, Sotirios A.
|metadata.dc.subject.category:||Mechanical Engineering||metadata.dc.subject.field:||Engineering and Technology||Issue Date:||2009||Publisher:||American Institute of Physics||Source:||Organized by the hellenic psysical society with cooperation of the psysics departments of universities in Greece: 7th international conference of the balkan physical union, Volume 1203, Pages 178-181||Abstract:||D.c. conductivity σ and thermal degradation measurements on PEDOT:PSS films of different thicknesses d = 50, 120 and 180 nm are reported. The experimental results are consistent with a hopping type carrier transport. For the films with thickness d = 50 nm, which consist of almost one single layer of PEDOT:PSS conductive grains, the conductivity and the heat aging are consistent with a hopping transport in a granular metal type structure. However, for films with d = 120 and 180 nm, in which many conductive grains constitute the film thickness, a completely different behaviour is exhibited. An explanation of this is proposed||URI:||http://ktisis.cut.ac.cy/handle/10488/7557||ISBN:||978-0-7354-0740-4||DOI:||10.1063/1.3322407||Rights:||© 2010 American Institute of Physics||metadata.dc.type:||Book Chapter|
|Appears in Collections:||Κεφάλαια βιβλίων/Book chapters|
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