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Title: A modified domain deformation theory on 1-D signal classification
Authors: Kim, Sung S.
Kasparis, Takis 
Keywords: Signal processing
Length measurement
Pattern recognition systems
Signal generators
Issue Date: 1998
Publisher: IEEE
Source: IEEE Signal Processing Letters, 1998, Volume 5, Issue 5, Pages 118-120
Abstract: In this paper, classification of one-dimensional (1-D) signals is accomplished using domain deformation theory. We use a metric defined on a domain deformation for measuring the distance between signals. By introducing a newly defined metric space, the assumption that domain deformation is applicable only to continuous signals is removed such that any kind of integrable signal can be classified. This method also has an advantage over the L2 metric, because the similarity of one-dimensional signals can be better measured for the purpose of classification.
ISSN: 10709908
DOI: 10.1109/97.668949
Rights: © 1998 IEEE
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