Hosea, Thomas Jeff Cockburn (rp00767)

Publications

Results 1-6 of 6 (Search time: 0.002 seconds).

Issue DateTitleAuthor(s)
1Aug-2003Postgrowth nondestructive characterization of dilute-nitride VCSELs using electroreflectance spectroscopyChoulis, Stelios A. ; Hosea, Thomas Jeff Cockburn ; Ghosh, Sandip Kumar 
230-Jan-2003Pressure and k · p studies of band parameters in dilute-N GaInNAs/GaAs multiple quantum wellsChoulis, Stelios A. ; Hosea, Thomas Jeff Cockburn ; Tomić, Stanko S. 
330-Oct-2002Electronic structure of InyGa1-yAs1-xNx/GaAs multiple quantum wells in the dilute-N regime from pressure and k⋅p studiesChoulis, Stelios A. ; Hosea, Thomas Jeff Cockburn ; Tomić, Stanko S. 
419-Dec-2001Influence of varying N-environments on the properties of (GaIn)(NAs) vertical-cavity surface-emitting lasersChoulis, Stelios A. ; Hosea, Thomas Jeff Cockburn ; Klar, Peter J. 
59-Jan-2001Effects of confinement on the coupling between nitrogen and band states in InGaAs1-xNx/GaAs (x ≤ 0.025) structures: pressure and temperature studiesChoulis, Stelios A. ; Weinstein, Bernard A. ; Hosea, Thomas Jeff Cockburn 
62001Growth characterisation of InxGa1-xAs/GaAs/AIAs vertical-cavity surface-emitting laser structure using photomodulated reflectanceChoulis, Stelios A. ; Hosea, Thomas Jeff Cockburn